[SPIE] Rydberg atom-based sensors for metrology and beyond

thaindnguyen Post time 7 day(s) ago | Show all posts |Read mode
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journal:Quantum Sensing, Imaging, and Precision Metrology IV

Authors:Christopher L. Holloway; Noah Schlossberger; Nikunjkumar Prajapati; Alexandra Artusio-Glimpse; Matthew Simons; Samuel Berweger; William Watterson

Published date:2026-3-5

DOI:10.1117/12.3086693

Article link:https://doi.org/10.1117/12.3086693

Article Source:SPIE


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