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[IEEE] Analysis and modeling of floating-gate EEPROM cells

Sevti Post time 6 day(s) ago | Show all posts |Read mode
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journal：IEEE Transactions on Electron Devices

Authors：A. Kolodny; S.T.K. Nieh; B. Eitan; J. Shappir

Published date：1986-6-

DOI：10.1109/t-ed.1986.22576

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=1485793

Article link：https://doi.org/10.1109/t-ed.1986.22576

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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