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[IEEE] Anomaly Detection in EVCS using Federated Learning with Auto-Optimized Edge Models

ashrafulparan Post time 7 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-09-12 23:45
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journal：IEEE Transactions on Industry Applications

Authors：Arif Hussain; Ankit Yadav; Gelli Ravikumar

Published date：2026--

DOI：10.1109/tia.2026.3661521

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11371685

Article link：https://doi.org/10.1109/tia.2026.3661521

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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