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[IEEE] gEOL: A Gradient-Based End-of-Life Criterion for Power Semiconductor Modules

Minhnguyen2k4 Post time 6 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-09-13 23:18
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journal：IEEE Transactions on Power Electronics

Authors：Yichi Zhang; Yi Zhang; Huai Wang

Published date：2024-3-

DOI：10.1109/tpel.2023.3339342

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10342744

Article link：https://doi.org/10.1109/tpel.2023.3339342

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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