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[IEEE] Impact of Current Stressed SAC305 and Sn-Bi Interconnect Anode and Cathode Side Thermomechanical Stability

Mushfique Post time 5 day(s) ago | Show all posts |Read mode
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journal：2025 IEEE 75th Electronic Components and Technology Conference (ECTC)

Authors：Tae-Kyu Lee; Yujin Park; Gnyaneshwar Ramakrishna; Young-Woo Lee; Hui-Joong Kim; Seul-Gi Lee; Choong-Un Kim

Published date：2025-5-27

DOI：10.1109/ectc51687.2025.00235

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11038217

Article link：https://doi.org/10.1109/ectc51687.2025.00235

Article Source：IEEE。


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