[IEEE] A fundamental overview of accelerated-testing analytic models

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journal:Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity

Authors:H. Caruso; A. Dasgupta

Published date:1998--

DOI:10.1109/rams.1998.653809

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=653809

Article link:https://doi.org/10.1109/rams.1998.653809

Article Source:IEEE


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Published in:
Annual Reliability and Maintainability Symposium. 1998 Proceedings.
International Symposium on Product Quality and Integrity

Date of Conference: 19-22 January 1998


LINK:
https://ieeexplore.ieee.org/document/653809

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