[Elsevier] Thickness-dependent shift of the ferroelectric composition window in ultrathin Hf1-xZrxO2 thin films

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journal:Applied Surface Science

Authors:Gunho Kim; Hyo-Bae Kim; Hye-Won Cho; Hyungseok Lee; Wonwoo Kho; Seung-Eon Ahn; Ji-Hoon Ahn

Published date:2026-9-

DOI:10.1016/j.apsusc.2026.167125

PDF link:https://www.sciencedirect.com/sc ... 169433226013292/pdf

Article link:https://doi.org/10.1016/j.apsusc.2026.167125



Article Source:Elsevier BV。



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