[IEEE] A Fast Secure Deletion Strategy for High-Density Flash Memory through WOM-v Codes

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journal:2023 60th ACM/IEEE Design Automation Conference (DAC)

Authors:Jinhua Cui; Kai Tang; Laurence T. Yang

Published date:2023-7-9

DOI:10.1109/dac56929.2023.10247911

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10247911

Article link:https://doi.org/10.1109/dac56929.2023.10247911

Article Source:IEEE


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