[IEEE] Low-Cost Scan-Chain-Based Technique to Recover Multiple Errors in TMR Systems

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journal:IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Authors:Mojtaba Ebrahimi; Seyed Ghassem Miremadi; Hossein Asadi; Mahdi Fazeli

Published date:2013-8-

DOI:10.1109/tvlsi.2012.2213102

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=6307891

Article link:https://doi.org/10.1109/tvlsi.2012.2213102

Article Source:Institute of Electrical and Electronics Engineers (IEEE)


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