[IOP] Optimization and integration of ultrathin e-beam grown HfO2gate dielectrics in MoS2transistors

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journal:Journal of Physics D: Applied Physics

Authors:Kolla Lakshmi Ganapathi; Navakanta Bhat; Sangeneni Mohan

Published date:2021-11-4

DOI:10.1088/1361-6463/ac19e0

PDF link:https://iopscience.iop.org/article/10.1088/1361-6463/ac19e0

Article link:https://doi.org/10.1088/1361-6463/ac19e0

Article Source:IOP Publishing


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