[Wiley] Atomistic Modeling of Processing–Structure–Property Correlations in Thin Films: A Critical Review

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journal:Advanced Engineering Materials

Authors:Tejasva Vashistha; Harsh Jain; Kishalay Raj; Raghavan Ranganathan

Published date:2026-8-5

DOI:10.1002/adem.70973

PDF link:https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/adem.70973

Article link:https://doi.org/10.1002/adem.70973

Article Source:Wiley


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