[Elsevier] Long-term drift of a bandgap voltage reference by molding compound oxidation during extended thermal aging

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journal:Microelectronics Reliability

Authors:Edinso Gabriel Marina Alonzo; René Theodora Hubertus Rongen; Michiel van Soestbergen; Pierre Turpin; Patrick Tounsi; Sonia Ben-Dhia

Published date:2026-4-

DOI:10.1016/j.microrel.2026.116043

PDF link:https://www.sciencedirect.com/sc ... 026271426000478/pdf

Article link:https://doi.org/10.1016/j.microrel.2026.116043



Article Source:Elsevier BV。



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