[Elsevier] Influence of Substrate connection on dynamic-RON drift of 650 V packaged GaN HEMTs

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journalㄩPower Electronic Devices and Components

AuthorsㄩM. Cioni; G. Giorgino; G. Cappellini; A. Chini; C. Miccoli; M.E. Castagna; A. Abbisogni; A. Contarino; F.A. Pizzardi; S. Smerzi; F. Iucolano

Published dateㄩ2025-3-

DOIㄩ10.1016/j.pedc.2025.100083

PDF linkㄩhttps://www.sciencedirect.com/sc ... 772370425000082/pdf

Article linkㄩhttps://doi.org/10.1016/j.pedc.2025.100083

Article SourceㄩElsevier BV


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