[Other] Identification and Characterization of Conductive Dislocations in p-GaN/AlGaN/GaN Heterojunctions on GaN-on-Si Substrates

johnfive Post time 1 hour(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-09-30 17:03
Reward20points

journalㄩInternational Symposium for Testing and Failure Analysis

AuthorsㄩM. Stabentheiner; D. Tilly; T. Schinnerl; A.A. Taylor; P. Javernik; M. Novak; C. Ostermaier; D. Pogany

Published dateㄩ--

DOIㄩ10.31399/asm.cp.istfa2024p0146

PDF linkㄩhttps://dl.asminternational.org/ ... /istfa2024p0146.pdf

Article linkㄩhttps://doi.org/10.31399/asm.cp.istfa2024p0146

Article SourceㄩASM International﹝


Remarkㄩ
Reply

Use magic Donate Report

All Reply0 Show all posts

Reply

You have to log in before you can reply Login | Register

Points Rules

Senior Member
  • post

  • reply

  • points

    2000


Latest Reply

Daily Top Contributors

Return to the list