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[IEEE] Cathodic Protection Measurement and Modeling

trigemink Post time 2026-10-19 01:22:08 | Show all posts |Read mode
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journalㄩIEEE Transactions on Instrumentation and Measurement

AuthorsㄩErik K. Saathoff; Michael J. Bishop; Isabelle C. Levitsky; Jacob D. Skimmons; Aaron W. Langham; Steven B. Leeb

Published dateㄩ2025--

DOIㄩ10.1109/tim.2024.3504558

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10764724

Article linkㄩhttps://doi.org/10.1109/tim.2024.3504558

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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