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[IEEE] YOLO-HMC: An Improved Method for PCB Surface Defect Detection

Riza1 Post time 2026-10-19 21:09:57 | Show all posts |Read mode
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journalㄩIEEE Transactions on Instrumentation and Measurement

AuthorsㄩMinghao Yuan; Yongbing Zhou; Xiaoyu Ren; Hui Zhi; Jian Zhang; Haojie Chen

Published dateㄩ2024--

DOIㄩ10.1109/tim.2024.3351241

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10384383

Article linkㄩhttps://doi.org/10.1109/tim.2024.3351241

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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