[Elsevier] A design-guided industrial defect detection method with enhanced camouflaged defect identification

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journalㄩExpert Systems with Applications

AuthorsㄩZican Hu; Jiaxiang Luo; Zixiang Hong; Jingyi Chen

Published dateㄩ2026-1-

DOIㄩ10.1016/j.eswa.2025.128996

PDF linkㄩhttps://www.sciencedirect.com/sc ... 957417425026132/pdf

Article linkㄩhttps://doi.org/10.1016/j.eswa.2025.128996

Article SourceㄩElsevier BV﹝


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