Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor

Post time 2026-10-20 23:20:11

journal：IEEE Transactions on Dielectrics and Electrical Insulation

Authors：Navneet Gandhi; Sunil Rathore; Rajeewa Kumar Jaisawal; P. N. Kondekar; Ankit Dixit; Naveen Kumar; Vihar Georgiev; Navjeet Bagga

Published date：2025-6-

DOI：10.1109/tdei.2024.3504407

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10764754

Article link：https://doi.org/10.1109/tdei.2024.3504407

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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Post time 2026-10-20 23:20:12

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[IEEE] Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor

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[IEEE] Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor