[IEEE] High-Reliability and High-Throughput CIM 10T-SRAM for Multiplication and Accumulation Operations With 274.3 GOPS and 200每237.5 TOPS/W

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journalㄩIEEE Transactions on Very Large Scale Integration (VLSI) Systems

AuthorsㄩWenjuan Lu; Lubin Xiang; Ling Wang; Chunyu Peng; Chenghu Dai; Zhiting Lin; Xiulong Wu

Published dateㄩ2025-4-

DOIㄩ10.1109/tvlsi.2024.3519748

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10816728

Article linkㄩhttps://doi.org/10.1109/tvlsi.2024.3519748

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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