[IEEE] Effect of Ion Implantation on Suppression of Stacking Fault Expansion in 4H-SiC

Sweetums33 Post time 7 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-10-25 05:15
Reward100points

journalㄩ2025 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC)

AuthorsㄩA. Myalitsin; V. Maeckel; T. Yoda; T. Ohba

Published dateㄩ2025-4-15

DOIㄩ10.23919/icep-iaac64884.2025.11003027

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11003027

Article linkㄩhttps://doi.org/10.23919/icep-iaac64884.2025.11003027

Article SourceㄩIEEE﹝


Remarkㄩ

Best Answer

Please approve

View Full Content

Reply

Use magic Donate Report

All Reply1 Show all posts
jakir_ete_ruet Post time 7 day(s) ago | Show all posts

This post has been completed

Completed attachments will be deleted within 24 hours.
Reply

Use magic Donate Report

Return to the list