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[IEEE] 2D Material-Based MVS Model and Circuit Performance Analysis for GeH Field-Effect Transistors

Nahian3241 Post time 7 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-10-25 18:29
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journalㄩIEEE Transactions on Nanotechnology

AuthorsㄩYiju Zhao; Youngki Yoon; Lan Wei

Published dateㄩ2023--

DOIㄩ10.1109/tnano.2023.3330165

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10309245

Article linkㄩhttps://doi.org/10.1109/tnano.2023.3330165

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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