[IEEE] Graph-Based Efficient Generation of Cell-Aware Models for Structural SRAM Testing

User_Ahamed Post time 6 day(s) ago | Show all posts |Read mode
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journalㄩIEEE Transactions on Device and Materials Reliability

AuthorsㄩGianmarco Mongelli; Dorian Ronga; Eric Faehn; Patrick Girard; Arnaud Virazel

Published dateㄩ2026-9-

DOIㄩ10.1109/tdmr.2026.3696162

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11534293

Article linkㄩhttps://doi.org/10.1109/tdmr.2026.3696162

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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