[Taylor&Francis] Closed-loop reinforcement learning control of AM process parameters using Digital Twin feedback for defect mitigation and print correction

TahQa Post time 6 day(s) ago | Show all posts |Read mode
This post will be closed automatically in 2026-10-27 19:41
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journalㄩNondestructive Testing and Evaluation

AuthorsㄩT. Suresh; Deepa Priya B S; Suganya S; S. Murugaveni; Saiyed Faiayaz Waris; Elangovan Muniyandy

Published dateㄩ--

DOIㄩ10.1080/10589759.2026.2674306

PDF linkㄩhttps://www.tandfonline.com/doi/pdf/10.1080/10589759.2026.2674306

Article linkㄩhttps://doi.org/10.1080/10589759.2026.2674306

Article SourceㄩInforma UK Limited﹝


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