[Other] System-Level Statistical Eye Diagram for Signal Integrity

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journalㄩElectronics

AuthorsㄩJunyong Park; Hyunwook Park

Published dateㄩ--

DOIㄩ10.3390/electronics13224387

PDF linkㄩhttps://www.mdpi.com/2079-9292/13/22/4387/pdf

Article linkㄩhttps://doi.org/10.3390/electronics13224387

Article SourceㄩMDPI AG﹝


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