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[IEEE] ELECTRICAL INTEGRITY RESILIENCE OF DATA CENTERS AND CRITICAL LOADS

zahirul85 Post time 4 day(s) ago | Show all posts |Read mode
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journalㄩIEEE Transactions on Industry Applications

AuthorsㄩGiuseppe Parise; Marco Allegri; Luigi Parise

Published dateㄩ2020--

DOIㄩ10.1109/tia.2020.2986288

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9066916

Article linkㄩhttps://doi.org/10.1109/tia.2020.2986288

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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