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[IEEE] On-wafer S-parameter Characterization of a D-band SIW Power Divider using Two-Port VNA

cgb Post time 5 hour(s) ago | Show all posts |Read mode
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journalㄩ2026 106th ARFTG Microwave Measurement Conference (ARFTG)

AuthorsㄩWeifeng Wu; Yunjiang Ding; Juncheng Xiong; James C. M. Hwang; Patrick Fay

Published dateㄩ2026-1-18

DOIㄩ10.1109/arftg68976.2026.11475011

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11475011

Article linkㄩhttps://doi.org/10.1109/arftg68976.2026.11475011

Article SourceㄩIEEE﹝


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