Electromagnetic Pulse Induced Failure Analysis of GaN HEMT Based Power Amplifier

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journal：IEEE Transactions on Power Electronics

Authors：Lei Wang; Changchun Chai; Tian-Long Zhao; Feng Wei; Wei-Shen Liu; Yutian Wang; Zhao Li; Le Xu; Fuxing Li; Yintang Yang

Published date：2024-1-

DOI：10.1109/tpel.2023.3315726

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10252017

Article link：https://doi.org/10.1109/tpel.2023.3315726

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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