[Wiley]
Effect of GaN/AlGaN Buffer Thickness on the Electrothermal Performance of AlGaN/GaN High Electron Mobility Transistors on Engineered Substrates
AuthorsㄩMarko J. Tadjer; Patrick Waltereit; Lutz Kirste; Stefan M邦ller; James Spencer Lundh; Alan G. Jacobs; Andrew D. Koehler; Pavel Komarov; Peter Raad; John Gaskins; Patrick Hopkins; Vlad Odnoblyudov; Cem Basceri; Travis J. Anderson; Karl D. Hobart
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