[IEEE] Document Image Forgery Detection Based on Deep Learning Models

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journalㄩ2022 International Symposium on Electrical, Electronics and Information Engineering (ISEEIE)

AuthorsㄩPiaoyang Yang; Wei Fang; Feng Zhang; Lifei Bai; Yuanyuan Gao

Published dateㄩ2022-2-

DOIㄩ10.1109/iseeie55684.2022.00014

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9853295

Article linkㄩhttps://doi.org/10.1109/iseeie55684.2022.00014

Article SourceㄩIEEE﹝


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