[Other] A load-lock compatible system for in situ electrical resistivity measurements during thin film growth

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journalㄩReview of Scientific Instruments

AuthorsㄩJ. J. Colin; Y. Diot; Ph. Guerin; B. Lamongie; F. Berneau; A. Michel; C. Jaouen; G. Abadias

Published dateㄩ2016-2-1

DOIㄩ10.1063/1.4940933

PDF linkㄩhttps://pubs.aip.org/aip/rsi/art ... 023902_1_online.pdf

Article linkㄩhttps://doi.org/10.1063/1.4940933

Article SourceㄩAIP Publishing﹝


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