[Elsevier] Junction temperature balance control for paralleled SiC MOSFETs based on active gate control

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journalㄩMicroelectronics Reliability

AuthorsㄩPing Liu; Xin Wang; Xin Liu; Kai Xiao; Yongjie Liu; Yingzhou Peng

Published dateㄩ2023-11-

DOIㄩ10.1016/j.microrel.2023.115218

PDF linkㄩhttps://www.sciencedirect.com/sc ... 026271423003189/pdf

Article linkㄩhttps://doi.org/10.1016/j.microrel.2023.115218

Article SourceㄩElsevier BV﹝


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