[Other] Topological semimetal interface resistivity scaling for vertical interconnect applications

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journalㄩApplied Physics Letters

AuthorsㄩNicholas A. Lanzillo; Utkarsh Bajpai; Ching-Tzu Chen

Published dateㄩ2024-4-29

DOIㄩ10.1063/5.0200403

PDF linkㄩhttps://pubs.aip.org/aip/apl/art ... 603_1_5.0200403.pdf

Article linkㄩhttps://doi.org/10.1063/5.0200403

Article SourceㄩAIP Publishing﹝


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