[Elsevier] Exploring the use of approximate TMR to mask transient faults in logic with low area overhead

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journalㄩMicroelectronics Reliability

AuthorsㄩIuri A.C. Gomes; Mayler G.A. Martins; Andr谷 I. Reis; Fernanda Lima Kastensmidt

Published dateㄩ2015-8-

DOIㄩ10.1016/j.microrel.2015.06.125

PDF linkㄩhttps://www.sciencedirect.com/sc ... 026271415300676/pdf

Article linkㄩhttps://doi.org/10.1016/j.microrel.2015.06.125

Article SourceㄩElsevier BV﹝


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