[Elsevier] Comparative study: AutoDPR-SEM for enhancing CNN reliability in SRAM-based FPGAs through autonomous reconfiguration

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journalㄩMicroelectronics Reliability

AuthorsㄩHaonan Tian; Younis Ibrahim; Rui Chen; Yixiu Wang; Chen Jin; George Belev; Li Chen

Published dateㄩ2024-6-

DOIㄩ10.1016/j.microrel.2024.115392

PDF linkㄩhttps://www.sciencedirect.com/sc ... 026271424000726/pdf

Article linkㄩhttps://doi.org/10.1016/j.microrel.2024.115392

Article SourceㄩElsevier BV﹝


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