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[IEEE] Feature Reconstruction: Far Field EM Side-Channel Attacks in Complex Environment

栦蚗詢 Post time 1 hour(s) ago | Show all posts |Read mode
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journalㄩIEEE Transactions on Information Forensics and Security

AuthorsㄩHuanyu Wang; Dalin He; Deng Tuo; Junnian Wang

Published dateㄩ2025--

DOIㄩ10.1109/tifs.2025.3611788

PDF linkㄩhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11172341

Article linkㄩhttps://doi.org/10.1109/tifs.2025.3611788

Article SourceㄩInstitute of Electrical and Electronics Engineers (IEEE)﹝


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