Short Circuit Detection and Fault Current Limiting Method for IGBTs

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journal：IEEE Transactions on Device and Materials Reliability

Authors：Mohamed Halick Mohamed Sathik; Prasanth Sundararajan; Firman Sasongko; Josep Pou; Viswanathan Vaiyapuri

Published date：2020-12-

DOI：10.1109/tdmr.2020.3018717

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9174661

Article link：https://doi.org/10.1109/tdmr.2020.3018717

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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