[IOP] Comparative microstructural analysis of V2O5 nanoparticles via x-ray diffraction (XRD) technique |
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Comparative microstructural analysis of V2O5 nanoparticles via x-ray diffraction (XRD) technique
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Thickness-dependent structural and growth evolution in relation to dielectric relaxation behavior and correlated barrier hopping conduction mechanism in Ni0.5Co0.5Fe2O4 ferrite thin films
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Spectrally selective Goos-Hnchen displacement in a single defect helical photonic crystal
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Effect of an inclined magnetic field on unsteady mixed convective stagnation point flow over a permeable stretching sheet with radiative heat transfer
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A geometric approach to Fermat principle as a demonstration of high school geometry and physical optics
