[IOP] Understanding semiconductor nanostructures via advanced electron microscopy and spectroscopy |
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Strain measurements of an aircraft wing using embedded CNT fiber sensor and wireless SHM sensor node
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Strain measurements of an aircraft wing using embedded CNT fiber sensor and wireless SHM sensor node
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Comparative microstructural analysis of V2O5 nanoparticles via x-ray diffraction (XRD) technique
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Thickness-dependent structural and growth evolution in relation to dielectric relaxation behavior and correlated barrier hopping conduction mechanism in Ni0.5Co0.5Fe2O4 ferrite thin films
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Spectrally selective Goos-Hnchen displacement in a single defect helical photonic crystal
